\u304a\u554f\u3044\u5408\u308f\u305b<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"Analog and Power Discrete<\/h6>\n
Optimal cost of test system for discrete to power MOSFETs with menu-driven programming, multi-stations capability.<\/p>\n","protected":false},"featured_media":6752,"template":"","meta":{"_acf_changed":false},"categories":[101],"tags":[],"class_list":["post-10660","products","type-products","status-publish","has-post-thumbnail","hentry","category-sts8200-cross"],"acf":[],"_links":{"self":[{"href":"https:\/\/accotest.benova.com.my\/ja\/wp-json\/wp\/v2\/products\/10660","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/accotest.benova.com.my\/ja\/wp-json\/wp\/v2\/products"}],"about":[{"href":"https:\/\/accotest.benova.com.my\/ja\/wp-json\/wp\/v2\/types\/products"}],"version-history":[{"count":0,"href":"https:\/\/accotest.benova.com.my\/ja\/wp-json\/wp\/v2\/products\/10660\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/accotest.benova.com.my\/ja\/wp-json\/wp\/v2\/media\/6752"}],"wp:attachment":[{"href":"https:\/\/accotest.benova.com.my\/ja\/wp-json\/wp\/v2\/media?parent=10660"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/accotest.benova.com.my\/ja\/wp-json\/wp\/v2\/categories?post=10660"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/accotest.benova.com.my\/ja\/wp-json\/wp\/v2\/tags?post=10660"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}