{"id":10662,"date":"2024-12-20T13:50:45","date_gmt":"2024-12-20T05:50:45","guid":{"rendered":"https:\/\/accotest.benova.com.my\/products\/sts8200-axe-fet\/"},"modified":"2024-12-20T13:50:45","modified_gmt":"2024-12-20T05:50:45","slug":"sts8200-axe-fet","status":"publish","type":"products","link":"https:\/\/accotest.benova.com.my\/ja\/products\/sts8200-axe-fet\/","title":{"rendered":"STS8200 AXE-FET"},"content":{"rendered":"\t\t
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\n\t\t\t\t\t\t\tAnalog and Power Test System\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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STS8200 CROSS Series<\/h1>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t
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\n\t\t\t\t\t\t\tSTS8200 AXE-FET\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\t\tAnalog Discrete and Wafer Test\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\t\tThe go-to highest parallelism test system for discrete MOSFETs, IGBTs, SiC, GaN to hard-docking wafer test system capability.\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\tGet Catalogue<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t
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\n\t\t\t\t\t\t\tTRUE Parallelism Static Test\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\t\tIntegration of test head based system for cost optimisation on MOSFET, IGBT, SiC, GaN devices with Dynamic RDSON.\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\t\tIntegration Advancement \t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\t\tMulti-site and multi-task capable with auxiliary equipment unification on avalanche and thermal resistance test requirements.\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\t\tOpen Architecture\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Specific customer software test methodology proliferation using C++ programming and open hardware design enabling custom circuitry on test head board.<\/p>\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

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Key Features<\/h3>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\t\tMaximum Voltage and Current Ratings:<\/b>\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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  • \u00b12000V\/20A (DC Static) for 16 sites in TRUE parallel<\/li>
  • High current DC up to 160A in serial<\/li>
  • Dynamic RDSON at 1000V\/10A in TRUE parallel<\/li>
  • 100kHz-1MHz ZMU (\u00b140V DC Bias up to \u00b12000V option)<\/li>
  • Avalanche and thermal resistance integration option<\/li><\/ul>\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t
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    \n\t\t\t\t\t\t\tEncompassing the STS8200 full floating VI resource supporting the test head advanced circuitry for high-density parallel test system for soft or hard-docking handler integration.\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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    \n\t\t\t\t\t\t\tAll AccoTEST test systems include comprehensive and no licence-based UI interface with full support for debug tools, waveform generation, and database generation tools with analytics. \n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t
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    Resources<\/h2>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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