{"id":10664,"date":"2025-03-06T16:10:12","date_gmt":"2025-03-06T08:10:12","guid":{"rendered":"https:\/\/accotest.benova.com.my\/products\/sts8200-axe-plus\/"},"modified":"2025-08-18T15:32:33","modified_gmt":"2025-08-18T07:32:33","slug":"sts8200-axe-plus","status":"publish","type":"products","link":"https:\/\/accotest.benova.com.my\/ja\/products\/sts8200-axe-plus\/","title":{"rendered":"STS8200 AXE-PLUS"},"content":{"rendered":"\t\t
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\n\t\t\t\t\t\t\tAnalog and Power Test System\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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STS8200 CROSS Series<\/h1>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t
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STS8200 AXE-PLUS<\/h2>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Analog and Power Modules<\/h3>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Leading high-power semiconductor testing systems capable of testing MOSFETs, IGBTs, SiC, GaN, KGD, PIM, IPM modules, and wafer.<\/p>\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\tGet Catalogue<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t
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Comprehensive Parametric Measurement<\/p>\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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Supports simultaneous testing of both static and dynamic parameters for IGBTs, MOSFETs, SiC, GaN, KGD, Wafer and other individual components and modules.<\/p>\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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Soft and Hard Docking Capable<\/p>\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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Integration of turret or pick-and-place handler via cables or hard-docking approach for reduced stray inductance on dynamic tests.<\/p>\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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Enables user specific test flow and methods with open architecture C++ programming of test resources.<\/p>\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

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Key Features<\/h3>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\t\tMaximum Voltage and Current Ratings:<\/b>\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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  • \u00b12000V\/1000A (DC Static)<\/li>
  • 100kHz-1MHz ZMU (\u00b140V DC Bias up to \u00b12000V option)<\/li>
  • Low leakage current range of \u00b1 1nA<\/li>
  • Precision 18-bit voltmeter measurement<\/li>
  • IC resource digital capability<\/li>
  • 1200V\/12000A dynamic test capabilities, hard or soft docking<\/li><\/ul>\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t
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    Features system mainframe of 26 universal slots for Analog, Digital, PMIC and Power Modules test resources with full floating VI for high voltage and high current stacking capabilities. High power DC and dynamic resources are placed on the test head for hard docking and precision measurement as close to the device under test (\u201cDUT\u201d).<\/p>\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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    All AccoTEST test systems include comprehensive and no licence-based UI interface with full support for debug tools, waveform generation, and database generation tools with analytics.<\/p>\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

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    Resources<\/h2>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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