Analog and Power Test System

STS8200 CROSS Series

STS8200

Analog, Digital to Power Discrete

Industry leading scalable semiconductor test platform for small signal analog, digital hybrid devices to power discrete.

STS8200 PMOS

Analog and Power Discrete

Optimal cost of test system for discrete to power MOSFETs with menu-driven programming, multi-stations capability.

STS8200 AXE-PM

Analog and Power Modules

The preferred discrete to power semiconductor test system for low to high power MOSFETs, IGBTs, SiC, GaN, KGD, PIM, and IPM modules.

STS8200 AXE-FET

Analog Discrete and Wafer Test

The go-to highest parallelism test system for discrete MOSFETs, IGBTs, SiC, GaN to hard-docking wafer test system capability.

STS8200 PIM

Analog and Power Bricks

Leading high-power-delivery power semiconductor test system catering multi-bridges and power bricks modules for EV mobility and solar industries.

STS8200 GaN Kit 2.0

Analog Discrete

The preferred GaN FET test system for static and dynamic test capabilities with simultaneous realtime capture for leakage tests in parallel.

Resources

HVDP

High Voltage Differential Probe resource for STS8200 PIM platform

HCM1K

High Current Module for STS8200 PIM platform

DTU12K

Dynamic Test Unit for STS8200 PIM platform

FGD

Floating Gate Driver resource for STS8200 PIM platform

INF

Test head communication interface board for STS8200 PIM platform

DTU3K

Dynamic Test Unit for STS8200 AXE-PM platform

HPU200

Floating High Power Unit VI Source Measure Module for STS8200 AXE-PM platform

AXE-INF

Communication and power supply board for STS8200 AXE-PM platform

AXE-CBIT

Control Bit Module for STS8200 AXE-PM platform

AXE-VIS

SMU interface board of STS8200 mainframe for STS8200 AXE-PM platform

AXE-ZMU

Impedance measurement resource module for STS8200 AXE-PM platform

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